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[n]	R. Divi?á, C. So??s, P. Vande Vyvre, and A. Vascotto, “The ALICE Experiment Control System”, in Proc. ICALEPCS'05, Geneva, Switzerland, Oct. 2005, paper O1_011. 

[n]	Y. B. Yan et al., “Data Acquisition System for Beam Instrumentation of SXFEL and DCLS”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 137-139. doi:10.18429/JACoW-IBIC2018-MOPC11

For LaTeX

%\cite{Divi?á:ICALEPCS05-O1_011} \bibitem{Divi?á:ICALEPCS05-O1_011} R. Divi?á, C. So??s, P. Vande Vyvre, and A. Vascotto, \textquotedblleft{The ALICE Experiment Control System}\textquotedblright, in \emph{Proc. ICALEPCS’05}, Geneva, Switzerland, Oct. 2005, paper O1_011. %\cite{Yan:IBIC18-MOPC11} \bibitem{Yan:IBIC18-MOPC11} Y. B. Yan \emph{et al.}, \textquotedblleft{Data Acquisition System for Beam Instrumentation of SXFEL and DCLS}\textquotedblright, in \emph{Proc. IBIC’18}, Shanghai, China, Sep. 2018, pp. 137--139. \doi{10.18429/JACoW-IBIC2018-MOPC11}

For BibTeX

@inproceedings{divi?á:icalepcs05-o1_011, author = {R. Divi?á and C. So??s and P. Vande Vyvre and A. Vascotto}, title = {{The ALICE Experiment Control System}}, booktitle = {Proc. ICALEPCS'05}, paper = {O1_011}, venue = {Geneva, Switzerland, Oct. 2005}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} } @inproceedings{yan:ibic18-mopc11, author = {Y. B. Yan and others}, title = {{Data Acquisition System for Beam Instrumentation of SXFEL and DCLS}}, booktitle = {Proc. IBIC'18}, pages = {137--139}, paper = {MOPC11}, venue = {Shanghai, China, Sep. 2018}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2018-MOPC11}, url = {https://jacow.org/IBIC2018/papers/MOPC11.pdf}, language = {english} }

References

• R. Divi?á, C. So??s, P. Vande Vyvre, and A. Vascotto, “The ALICE Experiment Control System”, in Proc. 10th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'05), Geneva, Switzerland, Oct. 2005, paper O1_011.
• Y. B. Yan et al., “Data Acquisition System for Beam Instrumentation of SXFEL and DCLS”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 137-139.