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[n]	W. A. van Kampen and J. Liedorp, “A Fast Beam Quality Measuring Device”, in Proc. PAC'71, Chicago, IL, USA, Mar. 1971, pp. 923-926. 
[n]	H.-D. Nuhn et al., “Characterization of Second Harmonic Afterburner Radiation at the LCLS”, in Proc. FEL'10, Malmö, Sweden, Aug. 2010, paper THOCI2, pp. 690-695. 

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