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[n]	J. Bosser et al., “Single Bunch Profile Measurement Using Synchrotron Light from an Undulator”, in Proc. PAC'83, Santa Fe, NM, USA, Mar. 1983, pp. 2164-2167. 
[n]	M. Yan, B. Beutner, C. Gerth, R. Ischebeck, and E. Prat, “Comparison of Quadrupole Scan and Multi-screen Method for the Measurement of Projected and Slice Emittance at the SwissFEL Injector Test Facility”, in Proc. FEL'14, Basel, Switzerland, Aug. 2014, paper THP088, pp. 941-944. 

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