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[n] G. L. Orlandi et al., “FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements.”, in Proc. IBIC'19, Malmö, Sweden, Sep. 2019, pp. 249-252. doi:10.18429/JACoW-IBIC2019-TUBO02
[n] G. Penco et al., “Beam Optics Measurements at FERMI by using Wire-Scanner”, in Proc. FEL'15, Daejeon, Korea, Aug. 2015, pp. 101-104. doi:10.18429/JACoW-FEL2015-MOP034
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References
- G. L. Orlandi et al., “FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements.”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 249-252.
- G. Penco et al., “Beam Optics Measurements at FERMI by using Wire-Scanner”, in Proc. 37th Int. Free Electron Laser Conf. (FEL'15), Daejeon, Korea, Aug. 2015, pp. 101-104.
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