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[n]	W. Bruns, “Error Sensitivity of a Double Side Coupled Muffin-Tin”, in Proc. EPAC'94, London, UK, Jun.-Jul. 1994, pp. 2107-2110. 
[n]	I. Podadera Aliseda et al., “HEBT Diagnostics for Commissioning, Control, and Characterization of the IFMIF-EVEDA Accelerator”, in Proc. HB'08, Nashville, TN, USA, Aug. 2008, paper WGF08, pp. 459-461. 
[n]	K.-H. Park et al., “Development of High Stabile Magnet Power Supply”, in Proc. IPAC'17, Copenhagen, Denmark, May 2017, pp. 3455-3457. doi:10.18429/JACoW-IPAC2017-WEPVA085

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