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[n]	W. A. van Kampen and J. Liedorp, “A Fast Beam Quality Measuring Device”, in Proc. PAC'71, Chicago, IL, USA, Mar. 1971, pp. 923-926. 
[n]	C. Rozario, J. N. Karande, V. Nanal, S. Pal, and R. G. Pillay, “A Novel Method of Beam Scanning Over a Large Sample Arear at PLF, Mumbai”, in Proc. HIAT'15, Yokohama, Japan, Sep. 2015, paper MOPA03, pp. 39-41. 

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