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[n]	S. B. Leith, X. Jiang, R. Ries, E. Seiler, and M. Vogel, “Deposition Parameter Effects on Niobium Nitride (NbN) Thin Films Deposited Onto Copper Substrates with DC Magnetron Sputtering”, in Proc. SRF'19, Dresden, Germany, Jun.-Jul. 2019, pp. 945-949. doi:10.18429/JACoW-SRF2019-THP043

[n]	S. Popovicet al., “”, in Proc. IPAC'15, Richmond, VA, USA, May 2015, pp. XX-XX. doi:10.18429/JACoW-IPAC2015-WEPWI033

[n]	J. M. Nogiec, K. Trombly-Freytag, D. Walbridge, and E. Desavouret, “An XML Driven Framework for Test Control and Data Analysis”, in Proc. ICALEPCS'01, San Jose, CA, USA, Nov. 2001, paper THAP073, pp. XX-XX. 

[n]	E. Sombrowski, A. Petrosyan, K. Rehlich, and W. Sch??tte, “jddd, a State-of-the-art Solution for Control Panel Development”, in Proc. ICALEPCS'11, Grenoble, France, Oct. 2011, paper THBHAUST04, pp. 1189-1192. 

For LaTeX

%\cite{Leith:SRF19-THP043} \bibitem{Leith:SRF19-THP043} S. B. Leith, X. Jiang, R. Ries, E. Seiler, and M. Vogel, \textquotedblleft{Deposition Parameter Effects on Niobium Nitride (NbN) Thin Films Deposited Onto Copper Substrates with DC Magnetron Sputtering}\textquotedblright, in \emph{Proc. SRF’19}, Dresden, Germany, Jun.-Jul. 2019, pp. 945--949. \doi{10.18429/JACoW-SRF2019-THP043} %\cite{:IPAC15-WEPWI033} \bibitem{:IPAC15-WEPWI033} , \textquotedblleft{}\textquotedblright, in \emph{Proc. IPAC’15}, Richmond, VA, USA, May 2015, pp. XX--XX. \doi{10.18429/JACoW-IPAC2015-WEPWI033} %\cite{Nogiec:ICALEPCS01-THAP073} \bibitem{Nogiec:ICALEPCS01-THAP073} J. M. Nogiec, K. Trombly-Freytag, D. Walbridge, and E. Desavouret, \textquotedblleft{An XML Driven Framework for Test Control and Data Analysis}\textquotedblright, in \emph{Proc. ICALEPCS’01}, San Jose, CA, USA, Nov. 2001, paper THAP073, pp. XX--XX. %\cite{Sombrowski:ICALEPCS11-THBHAUST04} \bibitem{Sombrowski:ICALEPCS11-THBHAUST04} E. Sombrowski, A. Petrosyan, K. Rehlich, and W. Sch??tte, \textquotedblleft{jddd, a State-of-the-art Solution for Control Panel Development}\textquotedblright, in \emph{Proc. ICALEPCS’11}, Grenoble, France, Oct. 2011, paper THBHAUST04, pp. 1189--1192.

For BibTeX

@inproceedings{leith:srf19-thp043, author = {S. B. Leith and X. Jiang and R. Ries and E. Seiler and M. Vogel}, title = {{Deposition Parameter Effects on Niobium Nitride (NbN) Thin Films Deposited Onto Copper Substrates with DC Magnetron Sputtering}}, booktitle = {Proc. SRF'19}, pages = {945--949}, paper = {THP043}, venue = {Dresden, Germany, Jun.-Jul. 2019}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-SRF2019-THP043}, url = {https://jacow.org/srf2019/papers/THP043.pdf}, language = {english} } @inproceedings{:ipac15-wepwi033, author = {}, title = {{}}, booktitle = {Proc. IPAC'15}, paper = {WEPWI033}, venue = {Richmond, VA, USA, May 2015}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IPAC2015-WEPWI033}, url = {https://jacow.org/IPAC2015/papers/WEPWI033.pdf}, language = {english} } @inproceedings{nogiec:icalepcs01-thap073, author = {J. M. Nogiec and K. Trombly-Freytag and D. Walbridge and E. Desavouret}, title = {{An XML Driven Framework for Test Control and Data Analysis}}, booktitle = {Proc. ICALEPCS'01}, paper = {THAP073}, venue = {San Jose, CA, USA, Nov. 2001}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/ica01/papers/THAP073.pdf}, language = {english} } @inproceedings{sombrowski:icalepcs11-thbhaust04, author = {E. Sombrowski and A. Petrosyan and K. Rehlich and W. Sch??tte}, title = {{jddd, a State-of-the-art Solution for Control Panel Development}}, booktitle = {Proc. ICALEPCS'11}, pages = {1189--1192}, paper = {THBHAUST04}, venue = {Grenoble, France, Oct. 2011}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/icalepcs2011/papers/THBHAUST04.pdf}, language = {english} }

References

• S. B. Leith, X. Jiang, R. Ries, E. Seiler, and M. Vogel, “Deposition Parameter Effects on Niobium Nitride (NbN) Thin Films Deposited Onto Copper Substrates with DC Magnetron Sputtering”, in Proc. 19th Int. Conf. RF Superconductivity (SRF'19), Dresden, Germany, Jun.-Jul. 2019, pp. 945-949.
• S. Popovicet al., “”, in Proc. 6th Int. Particle Accelerator Conf. (IPAC'15), Richmond, VA, USA, May 2015, pp. XX-XX.
• J. M. Nogiec, K. Trombly-Freytag, D. Walbridge, and E. Desavouret, “An XML Driven Framework for Test Control and Data Analysis”, in Proc. 8th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'01), San Jose, CA, USA, Nov. 2001, paper THAP073, pp. XX-XX.
• E. Sombrowski, A. Petrosyan, K. Rehlich, and W. Sch??tte, “jddd, a State-of-the-art Solution for Control Panel Development”, in Proc. 13th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'11), Grenoble, France, Oct. 2011, paper THBHAUST04, pp. 1189-1192.