JaCoW Logo

Reference Search

Favourites


For Word

[n]	T. Wehrli, M. B?Âge, J. Krempasky, and E. D. van Garderen, “Properties of X-ray Beam Position Monitors at the Swiss Light Source”, in Proc. EPAC'08, Genoa, Italy, Jun. 2008, paper THPC139, pp. 3312-3314. 
[n]	D. B. Dobson, A. J. Churby, and E. K. Krieger, “Managing a Product Called NIF - PLM Current State and Processes”, in Proc. ICALEPCS'13, San Francisco, CA, USA, Oct. 2013, paper MOPPC090, pp. 310-313. 

For LaTeX

Use Complete Form

For BibTeX

References

Back to search