[n] J. Wilgen and B. Beutner, “Fast Image Analysis for Beam Profile Measurement at the European XFEL”, in Proc. 16th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'17), Barcelona, Spain, Oct. 2017, pp. 1416-1419. doi:10.18429/JACoW-ICALEPCS2017-THPHA031
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Paper Title: Fast Image Analysis for Beam Profile Measurement at the European XFEL
Paper URL: https://jacow.org/icalepcs2017/papers/THPHA031.pdf
Conference: 16th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'17)
Paper ID: THPHA031
Location in proceedings: 1416-1419
Original Author String: J. Wilgen, B. Beutner [DESY, Hamburg, Germany]