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[n]	K. J. Gofron, Y. Q. Cai, and J. Wlodek, “On-Axis 3D Microscope for X-Ray Beamlines at NSLS-II”, in Proc. ICALEPCS'17, Barcelona, Spain, Oct. 2017, pp. 1048-1053. doi:10.18429/JACoW-ICALEPCS2017-WEBPL02

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