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[n]	M. Taborelli, F. Caspers, M. Mensi, L. S. Aguilera, and I. Montero, “Reduction of Secondary Electron (SEY) Yield Figures on Smooth Metallic Surfaces by Means of Magnetic Roughness”, in Proc. IPAC'13, Shanghai, China, May 2013, paper TUPWA041, pp. 1799-1801. 
[n]	J. Harris et al., “A Fast Beam Position Monitor for UMER”, in Proc. PAC'01, Chicago, IL, USA, Jun. 2001, paper TPAH077, pp. 1387-1389. 

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