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[n] F. Ewald, J. C. Biasci, L. Farvacque, and K. B. Scheidt, “Emittance Measurement Using X-Ray Lenses at the ESRF”, in Proc. IBIC'13, Oxford, UK, Sep. 2013, paper WEPF11, pp. 833-836.
[n] X. Lu et al., “Development progress of high-level applications for the HEPS”, in Proc. IPAC'23, Venice, Italy, May 2023, pp. 4259-4261. doi:10.18429/JACoW-IPAC2023-THPA125
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References
- F. Ewald, J. C. Biasci, L. Farvacque, and K. B. Scheidt, “Emittance Measurement Using X-Ray Lenses at the ESRF”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper WEPF11, pp. 833-836.
- X. Lu et al., “Development progress of high-level applications for the HEPS”, in Proc. 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper THPA125, pp. 4259-4261.
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