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[n] J. Zeigler, R. Carcagno, and M. Weichold, “Experimental Measurements of Radiation Damage to Power Diodes at Cryogenic Temperature”, in Proc. PAC'87, Washington D.C., USA, Mar. 1987, pp. 1537-1540.
[n] M. Tobiyama et al., “Bunch by Bunch Feedback Systems for J-PARC MR”, in Proc. IPAC'10, Kyoto, Japan, May 2010, paper WEPEB036, pp. 2767-2769.
[n] P. Junphong, Mr. Ano, S. Rattanarin, Dr. Suwannakachorn, A. Takahashi, and T. Vilaithong, “System Development of a Time-of-flight Spectrometer for Surface Analysis of Materials”, in Proc. EPAC'06, Edinburgh, UK, Jun. 2006, paper THPCH126, pp. 3095-3097.
[n] P. Junphong et al., “The System of Nanosecond 280-keV-He+ Pulsed Beam”, in Proc. PAC'05, Knoxville, TN, USA, May 2005, paper FPAE076, pp. 3982-3984.
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References
- J. Zeigler, R. Carcagno, and M. Weichold, “Experimental Measurements of Radiation Damage to Power Diodes at Cryogenic Temperature”, in Proc. 12th Particle Accelerator Conf. (PAC'87), Washington D.C., USA, Mar. 1987, pp. 1537-1540.
- M. Tobiyama et al., “Bunch by Bunch Feedback Systems for J-PARC MR”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper WEPEB036, pp. 2767-2769.
- P. Junphong, Mr. Ano, S. Rattanarin, Dr. Suwannakachorn, A. Takahashi, and T. Vilaithong, “System Development of a Time-of-flight Spectrometer for Surface Analysis of Materials”, in Proc. 10th European Particle Accelerator Conf. (EPAC'06), Edinburgh, UK, Jun. 2006, paper THPCH126, pp. 3095-3097.
- P. Junphong et al., “The System of Nanosecond 280-keV-He+ Pulsed Beam”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper FPAE076, pp. 3982-3984.
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