[n] V. Baglin et al., “The Secondary Electron Yield of Technical Materials and its Variaton with Surface Treatments”, in Proc. EPAC'00, Vienna, Austria, Jun. 2000, paper THXF102, pp. 217-221.
[n] I. Pinayev, B. N. Kosciuk, and O. Singh, “Preliminary Design of Pinhole Camera for NSLS-II Project”, in Proc. PAC'09, Vancouver, Canada, May 2009, paper TH5RFP015, pp. 3473-3475.
Use Complete Form