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[n]	K. Uchida et al., “A STUDY ON ROBUSTNESS OF NEA-GAAS PHOTOCATHODE”, in Proc. IPAC'14, Dresden, Germany, Jun. 2014, pp. 664-666. doi:10.18429/JACoW-IPAC2014-MOPRI032

[n]	J. F. Zhang and A. Loulergue, “Dipole Fringe Field Effects in the ThomX Ring”, in Proc. IPAC'13, Shanghai, China, May 2013, paper WEPEA003, pp. 2504-2506. 

For LaTeX

%\cite{Uchida:IPAC14-MOPRI032} \bibitem{Uchida:IPAC14-MOPRI032} K. Uchida \emph{et al.}, \textquotedblleft{A STUDY ON ROBUSTNESS OF NEA-GAAS PHOTOCATHODE}\textquotedblright, in \emph{Proc. IPAC’14}, Dresden, Germany, Jun. 2014, pp. 664--666. \doi{10.18429/JACoW-IPAC2014-MOPRI032} %\cite{Zhang:IPAC13-WEPEA003} \bibitem{Zhang:IPAC13-WEPEA003} J. F. Zhang and A. Loulergue, \textquotedblleft{Dipole Fringe Field Effects in the ThomX Ring}\textquotedblright, in \emph{Proc. IPAC’13}, Shanghai, China, May 2013, paper WEPEA003, pp. 2504--2506.

For BibTeX

@inproceedings{uchida:ipac14-mopri032, author = {K. Uchida and others}, title = {{A STUDY ON ROBUSTNESS OF NEA-GAAS PHOTOCATHODE}}, booktitle = {Proc. IPAC'14}, pages = {664--666}, paper = {MOPRI032}, venue = {Dresden, Germany, Jun. 2014}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IPAC2014-MOPRI032}, url = {https://jacow.org/IPAC2014/papers/MOPRI032.pdf}, language = {english} } @inproceedings{zhang:ipac13-wepea003, author = {J. F. Zhang and A. Loulergue}, title = {{Dipole Fringe Field Effects in the ThomX Ring}}, booktitle = {Proc. IPAC'13}, pages = {2504--2506}, paper = {WEPEA003}, venue = {Shanghai, China, May 2013}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/IPAC2013/papers/WEPEA003.pdf}, language = {english} }

References

• K. Uchida et al., “A STUDY ON ROBUSTNESS OF NEA-GAAS PHOTOCATHODE”, in Proc. 5th Int. Particle Accelerator Conf. (IPAC'14), Dresden, Germany, Jun. 2014, pp. 664-666.
• J. F. Zhang and A. Loulergue, “Dipole Fringe Field Effects in the ThomX Ring”, in Proc. 4th Int. Particle Accelerator Conf. (IPAC'13), Shanghai, China, May 2013, paper WEPEA003, pp. 2504-2506.