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[n]	Q. Demazeux, C. Szwaj, E. Roussel, B. Steffen, M. K. Czwalinna, and S. Bielawski, “Single-shot detection of short electron bunch shapes at MHz repetition rates using diversity electro-optic scheme with advanced reconstruction algorithms at EuXFEL and FLASH”, in Proc. IBIC'25, Liverpool, UK, Sep. 2025, pp. 746-749. doi:10.18429/JACoW-IBIC2025-WEPMO13

[n]	Y. Hao, V. Litvinenko, and V. Ptitsyn, “Electron Pinch Effect in Beam-Beam Interaction of ERL Based eRHIC”, in Proc. PAC'09, Vancouver, Canada, May 2009, paper WE6PFP058, pp. 2631-2633. 

For LaTeX

%\cite{Demazeux:IBIC25-WEPMO13} \bibitem{Demazeux:IBIC25-WEPMO13} Q. Demazeux, C. Szwaj, E. Roussel, B. Steffen, M. K. Czwalinna, and S. Bielawski, \textquotedblleft{Single-shot detection of short electron bunch shapes at MHz repetition rates using diversity electro-optic scheme with advanced reconstruction algorithms at EuXFEL and FLASH}\textquotedblright, in \emph{Proc. IBIC’25}, Liverpool, UK, Sep. 2025, pp. 746--749. \doi{10.18429/JACoW-IBIC2025-WEPMO13} %\cite{Hao:PAC09-WE6PFP058} \bibitem{Hao:PAC09-WE6PFP058} Y. Hao, V. Litvinenko, and V. Ptitsyn, \textquotedblleft{Electron Pinch Effect in Beam-Beam Interaction of ERL Based eRHIC}\textquotedblright, in \emph{Proc. PAC’09}, Vancouver, Canada, May 2009, paper WE6PFP058, pp. 2631--2633.

For BibTeX

@inproceedings{demazeux:ibic25-wepmo13, author = {Q. Demazeux and C. Szwaj and E. Roussel and B. Steffen and M. K. Czwalinna and S. Bielawski}, title = {{Single-shot detection of short electron bunch shapes at MHz repetition rates using diversity electro-optic scheme with advanced reconstruction algorithms at EuXFEL and FLASH}}, booktitle = {Proc. IBIC'25}, pages = {746--749}, paper = {WEPMO13}, venue = {Liverpool, UK}, series = {Int. Beam Instrum. Conf.}, number = {14}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {1}, year = {2026}, issn = {2673-5350}, isbn = {978-3-95-450262-2}, doi = {10.18429/JACoW-IBIC2025-WEPMO13}, language = {english} } @inproceedings{hao:pac09-we6pfp058, author = {Y. Hao and V. Litvinenko and V. Ptitsyn}, title = {{Electron Pinch Effect in Beam-Beam Interaction of ERL Based eRHIC}}, booktitle = {Proc. PAC'09}, pages = {2631--2633}, paper = {WE6PFP058}, venue = {Vancouver, Canada, May 2009}, series = {Particle Accelerator Conference}, number = {23}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/PAC2009/papers/WE6PFP058.pdf}, language = {english} }

References

• Q. Demazeux, C. Szwaj, E. Roussel, B. Steffen, M. K. Czwalinna, and S. Bielawski, “Single-shot detection of short electron bunch shapes at MHz repetition rates using diversity electro-optic scheme with advanced reconstruction algorithms at EuXFEL and FLASH”, in Proc. 14th International Beam Instrumentation Conference (IBIC'25), Liverpool, UK, Sep. 2025, pp. 746-749.
• Y. Hao, V. Litvinenko, and V. Ptitsyn, “Electron Pinch Effect in Beam-Beam Interaction of ERL Based eRHIC”, in Proc. 23rd Particle Accelerator Conf. (PAC'09), Vancouver, Canada, May 2009, paper WE6PFP058, pp. 2631-2633.