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[n]	S. P. Antipov et al., “Wakefield Breakdown Test of a Diamond-Loaded Accelerating Structure”, in Proc. PAC'11, New York, NY, USA, Mar.-Apr. 2011, paper THOBN6, pp. 2074-2076. 
[n]	L. Andolfato et al., “Behavioural Models for Device Control”, in Proc. ICALEPCS'17, Barcelona, Spain, Oct. 2017, pp. 1109-1115. doi:10.18429/JACoW-ICALEPCS2017-THBPL02
[n]	D.-O. Jeon, “The SNS linac commissioning  comparison of measurement and model”, in Proc. HB'06, Tsukuba, Japan, May-Jun. 2006, paper THBZ05, pp. 353-355. 
[n]	J. M. Maxson, I. V. Bazarov, B. M. Dunham, and K. W. Smolenski, “Optimization of DC Photogun Electrode Geometry”, in Proc. PAC'11, New York, NY, USA, Mar.-Apr. 2011, paper WEP245, pp. 1945-1947. 
[n]	J. N. Yan et al., “Measurement of Nanometer Electron Beam Sizes with Laser Interference using IPBSM”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper TUCC04, pp. 310-314. 
[n]	A. E. Candel et al., “Numerical Verification of the Power Transfer and Wakefield Coupling in the CLIC Two-beam Accelerator”, in Proc. PAC'11, New York, NY, USA, Mar.-Apr. 2011, paper MOOCS2, pp. 51-55. 

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