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[n]	C. Nieter, P. J. Mullowney, C. Roark, P. Stoltz, C. D. Zhou, and F. Marhauser, “RF Cavity Characterization with VORPAL”, in Proc. PAC'11, New York, NY, USA, Mar.-Apr. 2011, paper WEP163, pp. 1797-1799. 

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