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[n]	Y. Iwashita et al., “R&D of Thin Film Coating on Superconductors”, in Proc. SRF'17, Lanzhou, China, Jul. 2017, pp. 877-880. doi:10.18429/JACoW-SRF2017-THPB058

[n]	A. Chancé, J. Payet, and B. Dalena, “Analytical Methods for Statistical Analysis for the Correction of Coupling Due to Errors”, in Proc. IPAC'12, New Orleans, LA, USA, May 2012, paper TUPPC003, pp. 1152-1154. 

[n]	D. El Khechen, K. Oide, and F. Zimmermann, “Beam-Beam Blowup Issue After Low Emittance Tuning for FCC-ee”, in Proc. IPAC'19, Melbourne, Australia, May 2019, pp. 112-115. doi:10.18429/JACoW-IPAC2019-MOPGW019

For LaTeX

%\cite{Iwashita:SRF17-THPB058} \bibitem{Iwashita:SRF17-THPB058} Y. Iwashita \emph{et al.}, \textquotedblleft{R&D of Thin Film Coating on Superconductors}\textquotedblright, in \emph{Proc. SRF’17}, Lanzhou, China, Jul. 2017, pp. 877--880. \doi{10.18429/JACoW-SRF2017-THPB058} %\cite{Chancé:IPAC12-TUPPC003} \bibitem{Chancé:IPAC12-TUPPC003} A. Chancé, J. Payet, and B. Dalena, \textquotedblleft{Analytical Methods for Statistical Analysis for the Correction of Coupling Due to Errors}\textquotedblright, in \emph{Proc. IPAC’12}, New Orleans, LA, USA, May 2012, paper TUPPC003, pp. 1152--1154. %\cite{El Khechen:IPAC19-MOPGW019} \bibitem{El Khechen:IPAC19-MOPGW019} D. El Khechen, K. Oide, and F. Zimmermann, \textquotedblleft{Beam-Beam Blowup Issue After Low Emittance Tuning for FCC-ee}\textquotedblright, in \emph{Proc. IPAC’19}, Melbourne, Australia, May 2019, pp. 112--115. \doi{10.18429/JACoW-IPAC2019-MOPGW019}

For BibTeX

@inproceedings{iwashita:srf17-thpb058, author = {Y. Iwashita and others}, title = {{R&D of Thin Film Coating on Superconductors}}, booktitle = {Proc. SRF'17}, pages = {877--880}, paper = {THPB058}, venue = {Lanzhou, China, Jul. 2017}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-SRF2017-THPB058}, url = {https://jacow.org/srf2017/papers/THPB058.pdf}, language = {english} } @inproceedings{chancé:ipac12-tuppc003, author = {A. Chancé and J. Payet and B. Dalena}, title = {{Analytical Methods for Statistical Analysis for the Correction of Coupling Due to Errors}}, booktitle = {Proc. IPAC'12}, pages = {1152--1154}, paper = {TUPPC003}, venue = {New Orleans, LA, USA, May 2012}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/IPAC2012/papers/TUPPC003.pdf}, language = {english} } @inproceedings{el khechen:ipac19-mopgw019, author = {D. El Khechen and K. Oide and F. Zimmermann}, title = {{Beam-Beam Blowup Issue After Low Emittance Tuning for FCC-ee}}, booktitle = {Proc. IPAC'19}, pages = {112--115}, paper = {MOPGW019}, venue = {Melbourne, Australia, May 2019}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IPAC2019-MOPGW019}, url = {http://accelconf.web.cern.ch/ipac2019/papers/MOPGW019.pdf}, language = {english} }

References

• Y. Iwashita et al., “R&D of Thin Film Coating on Superconductors”, in Proc. 18th Int. Conf. RF Superconductivity (SRF'17), Lanzhou, China, Jul. 2017, pp. 877-880.
• A. Chancé, J. Payet, and B. Dalena, “Analytical Methods for Statistical Analysis for the Correction of Coupling Due to Errors”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper TUPPC003, pp. 1152-1154.
• D. El Khechen, K. Oide, and F. Zimmermann, “Beam-Beam Blowup Issue After Low Emittance Tuning for FCC-ee”, in Proc. 10th Int. Particle Accelerator Conf. (IPAC'19), Melbourne, Australia, May 2019, pp. 112-115.