Reference Search

Favourites

For Word

[n]	J. P. Ricaud, L. Cassinari, P. Dumas, P. Lebasque, and A. Nadji, “First Tests of the Top-up Gating at Synchrotron SOLEIL”, in Proc. IBIC'13, Oxford, UK, Sep. 2013, paper WEPC39, pp. 775-777. 

[n]	C. Xu, M. J. Kelley, C. E. Reece, and H. Tian, “Characterization of Scale-Dependent Roughness of Niobium Surfaces as a Function of Surface Treatment Processes”, in Proc. SRF'11, Chicago, IL, USA, Jul. 2011, paper THPO046, pp. 832-834. 

[n]	J. Bai, Q. S. Chen, and K. Fan, “Physical Design of a Rectangular RF Deflector for Ultrashort Bunch Length Measurement”, in Proc. LINAC'18, Beijing, China, Sep. 2018, pp. 872-874. doi:10.18429/JACoW-LINAC2018-THPO082

[n]	H. Tian, C. E. Reece, S. R. Brankovic, and N. Dole, “Detailed Nb Surface Morphology Evolution During Electropolishing for SRF Cavity Production”, in Proc. SRF'11, Chicago, IL, USA, Jul. 2011, paper THPO038, pp. 802-805. 

For LaTeX

%\cite{Ricaud:IBIC13-WEPC39} \bibitem{Ricaud:IBIC13-WEPC39} J. P. Ricaud, L. Cassinari, P. Dumas, P. Lebasque, and A. Nadji, \textquotedblleft{First Tests of the Top-up Gating at Synchrotron SOLEIL}\textquotedblright, in \emph{Proc. IBIC’13}, Oxford, UK, Sep. 2013, paper WEPC39, pp. 775--777. %\cite{CXu:SRF11-THPO046} \bibitem{CXu:SRF11-THPO046} C. Xu, M. J. Kelley, C. E. Reece, and H. Tian, \textquotedblleft{Characterization of Scale-Dependent Roughness of Niobium Surfaces as a Function of Surface Treatment Processes}\textquotedblright, in \emph{Proc. SRF’11}, Chicago, IL, USA, Jul. 2011, paper THPO046, pp. 832--834. %\cite{Bai:LINAC18-THPO082} \bibitem{Bai:LINAC18-THPO082} J. Bai, Q. S. Chen, and K. Fan, \textquotedblleft{Physical Design of a Rectangular RF Deflector for Ultrashort Bunch Length Measurement}\textquotedblright, in \emph{Proc. LINAC’18}, Beijing, China, Sep. 2018, pp. 872--874. \doi{10.18429/JACoW-LINAC2018-THPO082} %\cite{Tian:SRF11-THPO038} \bibitem{Tian:SRF11-THPO038} H. Tian, C. E. Reece, S. R. Brankovic, and N. Dole, \textquotedblleft{Detailed Nb Surface Morphology Evolution During Electropolishing for SRF Cavity Production}\textquotedblright, in \emph{Proc. SRF’11}, Chicago, IL, USA, Jul. 2011, paper THPO038, pp. 802--805.

For BibTeX

@inproceedings{ricaud:ibic13-wepc39, author = {J. P. Ricaud and L. Cassinari and P. Dumas and P. Lebasque and A. Nadji}, title = {{First Tests of the Top-up Gating at Synchrotron SOLEIL}}, booktitle = {Proc. IBIC'13}, pages = {775--777}, paper = {WEPC39}, venue = {Oxford, UK, Sep. 2013}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/IBIC2013/papers/WEPC39.pdf}, language = {english} } @inproceedings{cxu:srf11-thpo046, author = {C. Xu and M. J. Kelley and C. E. Reece and H. Tian}, title = {{Characterization of Scale-Dependent Roughness of Niobium Surfaces as a Function of Surface Treatment Processes}}, booktitle = {Proc. SRF'11}, pages = {832--834}, paper = {THPO046}, venue = {Chicago, IL, USA, Jul. 2011}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/SRF2011/papers/THPO046.pdf}, language = {english} } @inproceedings{bai:linac18-thpo082, author = {J. Bai and Q. S. Chen and K. Fan}, title = {{Physical Design of a Rectangular RF Deflector for Ultrashort Bunch Length Measurement}}, booktitle = {Proc. LINAC'18}, pages = {872--874}, paper = {THPO082}, venue = {Beijing, China}, series = {Linear Accelerator Conference}, number = {29}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {1}, year = {2019}, issn = {2226-0366}, isbn = {978-3-95-450194-6}, doi = {10.18429/JACoW-LINAC2018-THPO082}, url = {https://jacow.org/linac2018/papers/THPO082.pdf}, language = {english} } @inproceedings{tian:srf11-thpo038, author = {H. Tian and C. E. Reece and S. R. Brankovic and N. Dole}, title = {{Detailed Nb Surface Morphology Evolution During Electropolishing for SRF Cavity Production}}, booktitle = {Proc. SRF'11}, pages = {802--805}, paper = {THPO038}, venue = {Chicago, IL, USA, Jul. 2011}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/SRF2011/papers/THPO038.pdf}, language = {english} }

References

• J. P. Ricaud, L. Cassinari, P. Dumas, P. Lebasque, and A. Nadji, “First Tests of the Top-up Gating at Synchrotron SOLEIL”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper WEPC39, pp. 775-777.
• C. Xu, M. J. Kelley, C. E. Reece, and H. Tian, “Characterization of Scale-Dependent Roughness of Niobium Surfaces as a Function of Surface Treatment Processes”, in Proc. 15th Int. Conf. RF Superconductivity (SRF'11), Chicago, IL, USA, Jul. 2011, paper THPO046, pp. 832-834.
• J. Bai, Q. S. Chen, and K. Fan, “Physical Design of a Rectangular RF Deflector for Ultrashort Bunch Length Measurement”, in Proc. 29th Linear Accelerator Conf. (LINAC'18), Beijing, China, Sep. 2018, pp. 872-874.
• H. Tian, C. E. Reece, S. R. Brankovic, and N. Dole, “Detailed Nb Surface Morphology Evolution During Electropolishing for SRF Cavity Production”, in Proc. 15th Int. Conf. RF Superconductivity (SRF'11), Chicago, IL, USA, Jul. 2011, paper THPO038, pp. 802-805.