Reference Search

Favourites

For Word

[n]	P. Maheshwari et al., “SIMS and TEM Analysis of Niobium Bicrystals”, in Proc. SRF'11, Chicago, IL, USA, Jul. 2011, paper THPO028, pp. 776-780. 

[n]	R. Tomas and G. Rumolo, “A Technique to Measure Chromaticity Based on the Harmonic Analysis of a Longitudinally Kicked Beam”, in Proc. PAC'03, Portland, OR, USA, May 2003, paper WPAB082, pp. 2234-2236. 

[n]	E. F. Valderrama et al., “Mo-Re Films for SRF Applications”, in Proc. SRF'11, Chicago, IL, USA, Jul. 2011, paper THPO077, pp. 930-935. 

For LaTeX

%\cite{Maheshwari:SRF11-THPO028} \bibitem{Maheshwari:SRF11-THPO028} P. Maheshwari \emph{et al.}, \textquotedblleft{SIMS and TEM Analysis of Niobium Bicrystals}\textquotedblright, in \emph{Proc. SRF’11}, Chicago, IL, USA, Jul. 2011, paper THPO028, pp. 776--780. %\cite{Tomas:PAC03-WPAB082} \bibitem{Tomas:PAC03-WPAB082} R. Tomas and G. Rumolo, \textquotedblleft{A Technique to Measure Chromaticity Based on the Harmonic Analysis of a Longitudinally Kicked Beam}\textquotedblright, in \emph{Proc. PAC’03}, Portland, OR, USA, May 2003, paper WPAB082, pp. 2234--2236. %\cite{Valderrama:SRF11-THPO077} \bibitem{Valderrama:SRF11-THPO077} E. F. Valderrama \emph{et al.}, \textquotedblleft{Mo-Re Films for SRF Applications}\textquotedblright, in \emph{Proc. SRF’11}, Chicago, IL, USA, Jul. 2011, paper THPO077, pp. 930--935.

For BibTeX

@inproceedings{maheshwari:srf11-thpo028, author = {P. Maheshwari and others}, title = {{SIMS and TEM Analysis of Niobium Bicrystals}}, booktitle = {Proc. SRF'11}, pages = {776--780}, paper = {THPO028}, venue = {Chicago, IL, USA, Jul. 2011}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/SRF2011/papers/THPO028.pdf}, language = {english} } @inproceedings{tomas:pac03-wpab082, author = {R. Tomas and G. Rumolo}, title = {{A Technique to Measure Chromaticity Based on the Harmonic Analysis of a Longitudinally Kicked Beam}}, booktitle = {Proc. PAC'03}, pages = {2234--2236}, paper = {WPAB082}, venue = {Portland, OR, USA, May 2003}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/p03/papers/WPAB082.pdf}, language = {english} } @inproceedings{valderrama:srf11-thpo077, author = {E. F. Valderrama and others}, title = {{Mo-Re Films for SRF Applications}}, booktitle = {Proc. SRF'11}, pages = {930--935}, paper = {THPO077}, venue = {Chicago, IL, USA, Jul. 2011}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/SRF2011/papers/THPO077.pdf}, language = {english} }

References

• P. Maheshwari et al., “SIMS and TEM Analysis of Niobium Bicrystals”, in Proc. 15th Int. Conf. RF Superconductivity (SRF'11), Chicago, IL, USA, Jul. 2011, paper THPO028, pp. 776-780.
• R. Tomas and G. Rumolo, “A Technique to Measure Chromaticity Based on the Harmonic Analysis of a Longitudinally Kicked Beam”, in Proc. 20th Particle Accelerator Conf. (PAC'03), Portland, OR, USA, May 2003, paper WPAB082, pp. 2234-2236.
• E. F. Valderrama et al., “Mo-Re Films for SRF Applications”, in Proc. 15th Int. Conf. RF Superconductivity (SRF'11), Chicago, IL, USA, Jul. 2011, paper THPO077, pp. 930-935.