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[n]	A. Navitski, K. Fl?Âttmann, S. Lederer, and G. Mueller, “Novel UHV Scanning Anode Field Emission Microscope (SAFEM) for Dark Current Investigations on Photocathodes”, in Proc. SRF'09, Berlin, Germany, Sep. 2009, paper TUPPO044, pp. 312-315. 

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