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[n]	F. Sannibale, “Highlights from BIW'08”, in Proc. DIPAC'09, Basel, Switzerland, May 2009, paper MOOB01, pp. 14-18. 

[n]	A. Navitski, K. Fl?Âttmann, S. Lederer, and G. Mueller, “Novel UHV Scanning Anode Field Emission Microscope (SAFEM) for Dark Current Investigations on Photocathodes”, in Proc. SRF'09, Berlin, Germany, Sep. 2009, paper TUPPO044, pp. 312-315. 

For LaTeX

%\cite{Sannibale:DIPAC09-MOOB01} \bibitem{Sannibale:DIPAC09-MOOB01} F. Sannibale, \textquotedblleft{Highlights from BIW'08}\textquotedblright, in \emph{Proc. DIPAC’09}, Basel, Switzerland, May 2009, paper MOOB01, pp. 14--18. %\cite{Navitski:SRF09-TUPPO044} \bibitem{Navitski:SRF09-TUPPO044} A. Navitski, K. Fl?Âttmann, S. Lederer, and G. Mueller, \textquotedblleft{Novel UHV Scanning Anode Field Emission Microscope (SAFEM) for Dark Current Investigations on Photocathodes}\textquotedblright, in \emph{Proc. SRF’09}, Berlin, Germany, Sep. 2009, paper TUPPO044, pp. 312--315.

For BibTeX

@inproceedings{sannibale:dipac09-moob01, author = {F. Sannibale}, title = {{Highlights from BIW'08}}, booktitle = {Proc. DIPAC'09}, pages = {14--18}, paper = {MOOB01}, venue = {Basel, Switzerland, May 2009}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/d09/papers/MOOB01.pdf}, language = {english} } @inproceedings{navitski:srf09-tuppo044, author = {A. Navitski and K. Fl?Âttmann and S. Lederer and G. Mueller}, title = {{Novel UHV Scanning Anode Field Emission Microscope (SAFEM) for Dark Current Investigations on Photocathodes}}, booktitle = {Proc. SRF'09}, pages = {312--315}, paper = {TUPPO044}, venue = {Berlin, Germany, Sep. 2009}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/SRF2009/papers/TUPPO044.pdf}, language = {english} }

References

• F. Sannibale, “Highlights from BIW'08”, in Proc. 9th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'09), Basel, Switzerland, May 2009, paper MOOB01, pp. 14-18.
• A. Navitski, K. Fl?Âttmann, S. Lederer, and G. Mueller, “Novel UHV Scanning Anode Field Emission Microscope (SAFEM) for Dark Current Investigations on Photocathodes”, in Proc. 14th Int. Conf. RF Superconductivity (SRF'09), Berlin, Germany, Sep. 2009, paper TUPPO044, pp. 312-315.