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The page numbers for some of these references could not be added automatically. You must provide the page numbers from the original proceedings which is located at JACoW.org, and substitute ‘pp. XX-XX’ with the correct page numbers.
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[n] T. V. Shaftan, “Vacuum Window Design for High-Power Lasers”, in Proc. FEL'05, Palo Alto, CA, USA, Aug. 2005, paper TUPP043, pp. XX-XX.
[n] P. D. Gall, A. Goessel, V. Gubarev, and J. Iversen, “A Database for Superconducting Cavities for the TESLA Test Facility”, in Proc. SRF'05, Ithaca, NY, USA, Jul. 2005, paper THP21, pp. 507-509.
[n] T. V. Shaftan, J. Bengtsson, and S. L. Kramer, “Control of Dynamic Aperture with Insertion Devices”, in Proc. EPAC'06, Edinburgh, UK, Jun. 2006, paper THPLS091, pp. 3490-3492.
[n] T. Watanabe et al., “Experimental Characterization of the Seeded FEL Amplifier at the BNL SDL”, in Proc. FEL'05, Palo Alto, CA, USA, Aug. 2005, paper MOPP031, pp. XX-XX.
[n] T. V. Shaftan et al., “Radiation Spectrum Statistics in a High-Gain Free-Electron Laser at 266 nm”, in Proc. FEL'05, Palo Alto, CA, USA, Aug. 2005, paper MOOC003, pp. XX-XX.
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References
- T. V. Shaftan, “Vacuum Window Design for High-Power Lasers”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper TUPP043, pp. XX-XX.
- P. D. Gall, A. Goessel, V. Gubarev, and J. Iversen, “A Database for Superconducting Cavities for the TESLA Test Facility”, in Proc. 12th Int. Conf. RF Superconductivity (SRF'05), Ithaca, NY, USA, Jul. 2005, paper THP21, pp. 507-509.
- T. V. Shaftan, J. Bengtsson, and S. L. Kramer, “Control of Dynamic Aperture with Insertion Devices”, in Proc. 10th European Particle Accelerator Conf. (EPAC'06), Edinburgh, UK, Jun. 2006, paper THPLS091, pp. 3490-3492.
- T. Watanabe et al., “Experimental Characterization of the Seeded FEL Amplifier at the BNL SDL”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper MOPP031, pp. XX-XX.
- T. V. Shaftan et al., “Radiation Spectrum Statistics in a High-Gain Free-Electron Laser at 266 nm”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper MOOC003, pp. XX-XX.
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