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[n]	M. Yan, B. Beutner, C. Gerth, R. Ischebeck, and E. Prat, “Comparison of Quadrupole Scan and Multi-screen Method for the Measurement of Projected and Slice Emittance at the SwissFEL Injector Test Facility”, in Proc. FEL'14, Basel, Switzerland, Aug. 2014, paper THP088, pp. 941-944. 
[n]	V. Lee et al., “Laser-ionized plasma sources for plasma wakefield accelerators: Alignment technique, tolerance, and applications”, presented at the NAPAC'25, Sacramento, California, USA, Aug. 2025, paper WEP053, unpublished. 
[n]	R. Leh?® and J.-L. Vay, “Review of Spectral Maxwell Solvers for Electromagnetic Particle-in-Cell: Algorithms and Advantages”, in Proc. ICAP'18, Key West, Florida, USA, Oct. 2018, pp. 345-349. doi:10.18429/JACoW-ICAP2018-WEPLG05
[n]	M. W. Guetg, F.-J. Decker, Y. Ding, P. Emma, Z. Huang, and T. J. Maxwell, “Measurement of Advanced Dispersion-based Beam-tilt Correction”, in Proc. IPAC'16, Busan, Korea, May 2016, pp. 813-816. doi:10.18429/JACoW-IPAC2016-MOPOW045
[n]	M. Patecki et al., “Contribution of Optical Aberrations to Spot-size Increase with Bunch Intensity at ATF2”, in Proc. IPAC'15, Richmond, VA, USA, May 2015, pp. 455-458. doi:10.18429/JACoW-IPAC2015-MOPJE065
[n]	C. Bonavolonta, F. Laviano, V. Palmieri, and M. Valentino, “Application of Flux Gate Magnetometry to Electropolishing”, in Proc. SRF'03, Lübeck, Germany, Sep. 2003, paper TUP25, pp. 351-356. 

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