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[n]	A. Garcia Mu??oz and S. Gabourin, “Testing Digital Electronic Protection Systems”, in Proc. ICALEPCS'11, Grenoble, France, Oct. 2011, paper WEPMU002, pp. 1047-1050. 
[n]	L. Wang, A. Chao, and J. Wei, “Geometric Effects on Electron Cloud”, in Proc. PAC'07, Albuquerque, NM, USA, Jun. 2007, paper FRPMS081, pp. 4243-4245. 

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