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[n]	M. Wenskat, S. Aderhold, E. Elsen, S. Karstensen, F. Schlander, and L. Steder, “Image Processing for Characterization of Surfaces of Superconducting RF Cavities”, in Proc. IPAC'12, New Orleans, LA, USA, May 2012, paper WEPPC007, pp. 2218-2220. 

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