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[n]	C. Xu, M. J. Kelley, and C. E. Reece, “Analyzing Surface Roughness Dependence of Linear RF Losses”, in Proc. LINAC'12, Tel Aviv, Israel, Sep. 2012, paper MOPB018, pp. 210-212. 
[n]	T. Junginger, W. Weingarten, R. Seviour, and C. P. Welsch, “RF and Surface Properties of Bulk Niobium and Niobium Film Samples”, in Proc. IPAC'12, New Orleans, LA, USA, May 2012, paper WEPPC033, pp. 2278-2280. 

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