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[n]	M. Yan, B. Beutner, C. Gerth, R. Ischebeck, and E. Prat, “Comparison of Quadrupole Scan and Multi-screen Method for the Measurement of Projected and Slice Emittance at the SwissFEL Injector Test Facility”, in Proc. FEL'14, Basel, Switzerland, Aug. 2014, paper THP088, pp. 941-944. 
[n]	A. D. Palczewski, R. L. Geng, and H. Tian, “Optimizing Centrifugal Barrel Polishing for Mirror Finish SRFCavity and Rf Tests at Jefferson Lab”, in Proc. IPAC'12, New Orleans, LA, USA, May 2012, paper WEPPC094, pp. 2435-2437. 
[n]	C. Xu, M. J. Kelley, C. E. Reece, and H. Tian, “Characterization of Scale-Dependent Roughness of Niobium Surfaces as a Function of Surface Treatment Processes”, in Proc. SRF'11, Chicago, IL, USA, Jul. 2011, paper THPO046, pp. 832-834. 

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