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[n]	P. Forck, T. Hoffmann, O. Jagutzki, U. Meyer, H. Schmidt-Boecking, and P. Strehl, “A Fast Residual-Gas Ionization Monitor for Intense Stored Heavy Ions”, in Proc. EPAC'98, Stockholm, Sweden, Jun. 1998, paper WEP04A, pp. 1562-1564. 
[n]	A. T. Wu et al., “Surface Treatments of Nb by Buffered Electropolishing”, in Proc. SRF'09, Berlin, Germany, Sep. 2009, paper THPPO064, pp. 755-759. 
[n]	H. Xu, P. Liang, Y. Peng, and N. Wang, “Studies of coupled-bunch instabilities in the HEPS booster”, in Proc. IPAC'23, Venice, Italy, May 2023, pp. 3566-3569. doi:10.18429/JACoW-IPAC2023-WEPL188
[n]	H. Tarawneh, H. Nishimura, D. Robin, C. Steier, C. Sun, and W. Wan, “Initial Lattice Design Studies for a Diffraction Limited Upgrade of the Advanced Light Source”, in Proc. NAPAC'13, Pasadena, CA, USA, Sep.-Oct. 2013, paper MOPHO23, pp. 288-290. 
[n]	K. Ozeki, Y. Higurashi, T. Nakagawa, and J. Ohnishi, “Emittance Measurements for U Ion Beams Produced from RIKEN 28 GHz SC-ECRIS”, in Proc. ECRIS'12, Sydney, Australia, Sep. 2012, paper WEPP08, pp. 130-132. 

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