[n] X. Gu et al., “Commissioning RHIC's Electron Lens”, in Proc. NAPAC'13, Pasadena, CA, USA, Sep.-Oct. 2013, paper TUOCA2, pp. 416-418.
[n] I. Ben-Zvi, R. Malone, X. J. Wang, and V. Yakimenko, “High-Resolution Beam Profile Monitor R&D at BNL ATF”, in Proc. EPAC'00, Vienna, Austria, Jun. 2000, paper WEP1B17, pp. 1821-1823.
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