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[n] T. Hoffmann, H. Bräuning, R. N. Geißler, and T. Milosic, “Status of the MicroTCA Based Beam Instrumentation DAQ Systems at GSI and FAIR”, in Proc. ICALEPCS'23, Cape Town, South Africa, Oct. 2023, pp. 239-243. doi:10.18429/JACoW-ICALEPCS2023-MO4AO07
[n] M. Wiencek et al., “Tests of the Accelerating Cryomodules for the European X-Ray Free Electron Laser”, in Proc. SRF'13, Paris, France, Sep. 2013, paper MOP054, pp. 244-246.
[n] S. B. Felch, M. I. Current, and M. C. Taylor, “Ion Implantation for Semiconductor Devices: The Largest Use of Industrial Accelerators”, in Proc. NAPAC'13, Pasadena, CA, USA, Sep.-Oct. 2013, paper WEYB2, pp. 740-744.
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References
- T. Hoffmann, H. Bräuning, R. N. Geißler, and T. Milosic, “Status of the MicroTCA Based Beam Instrumentation DAQ Systems at GSI and FAIR”, in Proc. 19th International Conference on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'23), Cape Town, South Africa, Oct. 2023, paper MO4AO07, pp. 239-243.
- M. Wiencek et al., “Tests of the Accelerating Cryomodules for the European X-Ray Free Electron Laser”, in Proc. 16th Int. Conf. RF Superconductivity (SRF'13), Paris, France, Sep. 2013, paper MOP054, pp. 244-246.
- S. B. Felch, M. I. Current, and M. C. Taylor, “Ion Implantation for Semiconductor Devices: The Largest Use of Industrial Accelerators”, in Proc. North American Particle Accelerator Conf. (NAPAC'13), Pasadena, CA, USA, Sep.-Oct. 2013, paper WEYB2, pp. 740-744.
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