[n] S. Kato, H. Hayano, T. Kubo, T. Noguchi, T. Saeki, and M. Sawabe, “Study on Niobium Scratch and Tantalum or Carbonaceous Contamination at Niobium Surface with Field Emission Scanner”, in Proc. 16th Int. Conf. RF Superconductivity (SRF'13), Paris, France, Sep. 2013, paper TUP108, pp. 731-735.
Use Abbreviated Form
Paper Title: Study on Niobium Scratch and Tantalum or Carbonaceous Contamination at Niobium Surface with Field Emission Scanner
Paper URL: https://jacow.org/SRF2013/papers/TUP108.pdf
Conference: 16th Int. Conf. RF Superconductivity (SRF'13)
Paper ID: TUP108
Location in proceedings: 731-735
Original Author String: S. Kato, H. Hayano, T. Kubo, T. Noguchi, T. Saeki, M. Sawabe [KEK, Ibaraki, Japan]