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[n]	M. Krishnan, S. F. Chapman, I. Irfan, K. M. Velas, J. K. Spradlin, and H. Tian, “Bulk Niobium Polishing and Electropolishing Steps for Thinfilm Coated Copper SRF Cavities”, in Proc. SRF'15, Whistler, Canada, Sep. 2015, paper TUPB034, pp. 633-637. 
[n]	J. Zeigler, R. Carcagno, and M. Weichold, “Experimental Measurements of Radiation Damage to Power Diodes at Cryogenic Temperature”, in Proc. PAC'87, Washington D.C., USA, Mar. 1987, pp. 1537-1540. 

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