[n] T. Nakagawa, “28 GHz SC-ECRIS at RIBF”, in Proc. Cyclotrons'10, Lanzhou, China, Sep. 2010, paper WEM1CIO02, pp. 321-326.
[n] V. L. Dorokhov et al., “The New Optical Device for Turn to Turn Beam Profile Measurement”, in Proc. IBIC'16, Barcelona, Spain, Sep. 2016, pp. 593-596. doi:10.18429/JACoW-IBIC2016-WEBL04
Use Complete Form