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[n]	D. Goetz, J. Grillenberger, M. Humbel, R. Kan, M. Schneider, L. Stingelin, and H. Zhang, “Disturbance Effects Caused by RF Power Leaking Out From Cavities in the PSI Ringcyclotron”, in Proc. Cyclotrons'10, Lanzhou, China, Sep. 2010, paper WEM2CCO03, pp. 341-343. 

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