[n] A. A. Mikhailichenko, “Test of SC Undulator for ILC”, in Proc. EPAC'06, Edinburgh, UK, Jun. 2006, paper MOPLS107, pp. 813-815.
[n] M. A. Harrison, R. B. Agustsson, P. S. Chang, T. J. Hodgetts, A. Y. Murokh, and M. Ruelas, “Design of a Fast, XFEL-quality Wire Scanner”, in Proc. IPAC'13, Shanghai, China, May 2013, paper MOPWA080, pp. 867-869.
Use Complete Form