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[n]	J. G. Lopes, F. A. Corr?¬a Alegria, L. M. Redondo, and J. Rocha, “High Resolution Ion Beam Profile Measurement System”, in Proc. ICALEPCS'11, Grenoble, France, Oct. 2011, paper MOPKS003, pp. 164-167. 
[n]	J. P. Girardeau-Montaut et al., “New Electron Source Assisted by Two Lasers”, in Proc. EPAC'88, Rome, Italy, Jun. 1988, pp. 1041-1044. 

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