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[n]	A. V. Feschenko and P. N. Ostroumov, “Bunch Shape Analyser with Transverse Scanning of the Low Energy Secondary Electrons”, in Proc. EPAC'90, Nice, France, Jun. 1990, pp. 750-753. 
[n]	J. W. Angle, E. M. Lechner, A. D. Palczewski, C. E. Reece, M. J. Kelley, and F. A. Stevie, “SIMS Sample Holder and Grain Orientation Effects”, in Proc. SRF'21, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 401. doi:10.18429/JACoW-SRF2021-TUPFDV002
[n]	U. Pudasaini, M. J. Kelley, G. V. Eremeev, and C. E. Reece, “Local Composition and Topography of Nb3Sn Diffusion Coatings on Niobium”, in Proc. SRF'15, Whistler, Canada, Sep. 2015, paper TUPB054, pp. 703-707. 

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