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[n]	R. E. Laxdal, T. J. Buck, S. Gheidi, R. Kiefl, M. Liepe, and S. Posen, “Testing Nb3Sn Coating Using muSR”, in Proc. SRF'15, Whistler, Canada, Sep. 2015, paper TUPB041, pp. 651-655. 
[n]	J. Poate and M. I. Current, “Industrial Applications of Ion Implantation for Doping and Modification of Semiconductor Materials”, presented at the PAC'01, Chicago, IL, USA, Jun. 2001, paper FOAA008, unpublished. 
[n]	J. M. Ortega, “Single-pass FELs”, in Proc. EPAC'90, Nice, France, Jun. 1990, pp. 115-119. 

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