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[n] R. E. Laxdal, T. J. Buck, S. Gheidi, R. Kiefl, M. Liepe, and S. Posen, “Testing Nb3Sn Coating Using muSR”, in Proc. SRF'15, Whistler, Canada, Sep. 2015, paper TUPB041, pp. 651-655.
[n] J. Poate and M. I. Current, “Industrial Applications of Ion Implantation for Doping and Modification of Semiconductor Materials”, presented at the PAC'01, Chicago, IL, USA, Jun. 2001, paper FOAA008, unpublished.
[n] J. M. Ortega, “Single-pass FELs”, in Proc. EPAC'90, Nice, France, Jun. 1990, pp. 115-119.
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References
- R. E. Laxdal, T. J. Buck, S. Gheidi, R. Kiefl, M. Liepe, and S. Posen, “Testing Nb3Sn Coating Using muSR”, in Proc. 17th Int. Conf. RF Superconductivity (SRF'15), Whistler, Canada, Sep. 2015, paper TUPB041, pp. 651-655.
- J. Poate and M. I. Current, “Industrial Applications of Ion Implantation for Doping and Modification of Semiconductor Materials”, presented at the 19th Particle Accelerator Conf. (PAC'01), Chicago, IL, USA, Jun. 2001, paper FOAA008, unpublished.
- J. M. Ortega, “Single-pass FELs”, in Proc. 2nd European Particle Accelerator Conf. (EPAC'90), Nice, France, Jun. 1990, pp. 115-119.
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