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[n]	A. Noda et al., “Low Energy Beam Transport and Matching Section under Space Charge Effect”, in Proc. EPAC'94, London, UK, Jun.-Jul. 1994, pp. 2423-2426. 

[n]	L. X. Hu, K. Z. Ding, Y. Song, and Y. C. Wu, “Calibration and Image Restoration for the Beam Profile Measurement System”, in Proc. IBIC'20, Santos, Brazil, Sep. 2020, pp. 276-280. doi:10.18429/JACoW-IBIC2020-THPP34

For LaTeX

%\cite{Noda:EPAC94} \bibitem{Noda:EPAC94} A. Noda \emph{et al.}, \textquotedblleft{Low Energy Beam Transport and Matching Section under Space Charge Effect}\textquotedblright, in \emph{Proc. EPAC’94}, London, UK, Jun.-Jul. 1994, pp. 2423--2426. %\cite{LXHu:IBIC20-THPP34} \bibitem{LXHu:IBIC20-THPP34} L. X. Hu, K. Z. Ding, Y. Song, and Y. C. Wu, \textquotedblleft{Calibration and Image Restoration for the Beam Profile Measurement System}\textquotedblright, in \emph{Proc. IBIC’20}, Santos, Brazil, Sep. 2020, pp. 276--280. \doi{10.18429/JACoW-IBIC2020-THPP34}

For BibTeX

@inproceedings{noda:epac94, author = {A. Noda and others}, title = {{Low Energy Beam Transport and Matching Section under Space Charge Effect}}, booktitle = {Proc. EPAC'94}, pages = {2423--2426}, paper = {}, venue = {London, UK, Jun.-Jul. 1994}, series = {European Particle Accelerator Conference}, number = {4}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} } @inproceedings{lxhu:ibic20-thpp34, author = {L. X. Hu and K. Z. Ding and Y. Song and Y. C. Wu}, title = {{Calibration and Image Restoration for the Beam Profile Measurement System}}, booktitle = {Proc. IBIC'20}, pages = {276--280}, paper = {THPP34}, venue = {Santos, Brazil}, series = {International Beam Instrumentation Conference}, number = {9}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2020}, issn = {2673-5350}, isbn = {978-3-95-450222-6}, doi = {10.18429/JACoW-IBIC2020-THPP34}, url = {http://accelconf.web.cern.ch/ibic2020/papers/THPP34.pdf}, language = {english} }

References

• A. Noda et al., “Low Energy Beam Transport and Matching Section under Space Charge Effect”, in Proc. 4th European Particle Accelerator Conf. (EPAC'94), London, UK, Jun.-Jul. 1994, pp. 2423-2426.
• L. X. Hu, K. Z. Ding, Y. Song, and Y. C. Wu, “Calibration and Image Restoration for the Beam Profile Measurement System”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 276-280.