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[n]	X. Y. Chang et al., “Measurement of the Secondary Emission Yield of a Thin Diamond Window in Transmission Mode”, in Proc. PAC'05, Knoxville, TN, USA, May 2005, paper RPPE032, pp. 2251-2253. 
[n]	M. Krasilnikov, F. Stephan, G. Asova, and J. Saisut, “Methodical Studies for Tomographic Reconstruction As a Novel Method For Emittance Measurements At the PITZ Facility”, in Proc. LINAC'10, Tsukuba, Japan, Sep. 2010, paper TUP097, pp. 638-640. 
[n]	R. E. Daniels, R. W. Goodwin, and M. R. Storm, “The NAL Computer Control System”, in Proc. PAC'73, San Francisco, CA, USA, Mar. 1973, pp. 505-510. 

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