JaCoW Logo

Reference Search

Favourites


For Word

[n]	W. R. Rawnsley, G. H. Mackenzie, and T. C. Ries, “A Scanning Secondary Emission Profile Monitor”, in Proc. PAC'87, Washington D.C., USA, Mar. 1987, pp. 553-556. 
[n]	E. D. Courant, “Effect of RF Noise on Stored Beams”, in Proc. PAC'73, San Francisco, CA, USA, Mar. 1973, pp. 852-853. 

For LaTeX

Use Complete Form

For BibTeX

References

Back to search