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[n]	T. G. Jurgens, F. A. Harfoush, and G. W. Saewert, “Xwake 1.0: A New Tool for Wakefield and Impedance Calculations”, in Proc. EPAC'94, London, UK, Jun.-Jul. 1994, pp. 1318-1321. 
[n]	B. E. Bjaerngard, G. T. Y. Chen, and B. J. Maddox, “High Resolution Beam Profile Measurements Using Phosphorescence”, in Proc. PAC'75, Washington D.C., USA, Mar. 1975, pp. 1558-1561. 

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