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[n] T. P. Wangler, F. W. Guy, and I. Hofmann, “The Influence of Equipartitioning on the Emittance of Intense Charged-Particle Beams”, in Proc. LINAC'86, Stanford, CA, USA, Sep. 1986, paper WE3-36, pp. 340-345.
[n] R. C. Trendler, “Characteristics of Inversion Operation on Fermilab Phase Controlled Pulsed Power Supplies”, in Proc. PAC'77, Chicago, IL, USA, Mar. 1977, pp. 1285-1287.
[n] A. Berlin et al., “Balanced Optical-Microwave Phase Detector for 800-nm Pulsed Lasers with Sub-Femtosecond Resolution”, in Proc. FEL'19, Hamburg, Germany, Aug. 2019, pp. 322-324. doi:10.18429/JACoW-FEL2019-WEP003
[n] Y. T. Yan and Y. Cai, “Precision Measurement of Coupling Ellipses Parameters in a Storage Ring”, in Proc. PAC'05, Knoxville, TN, USA, May 2005, paper MPPE059, pp. 3459-3461.
[n] G. D'Auria et al., “Installation and Tests of the X-Band Power Plant for the FERMI@Elettra Project”, in Proc. IPAC'12, New Orleans, LA, USA, May 2012, paper THPPC054, pp. 3410-3412.
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References
- T. P. Wangler, F. W. Guy, and I. Hofmann, “The Influence of Equipartitioning on the Emittance of Intense Charged-Particle Beams”, in Proc. 1986 Linear Accelerator Conf. (LINAC'86), Stanford, CA, USA, Jun. 1986, paper WE3-36, pp. 340-345.
- R. C. Trendler, “Characteristics of Inversion Operation on Fermilab Phase Controlled Pulsed Power Supplies”, in Proc. 7th Particle Accelerator Conf. (PAC'77), Chicago, IL, USA, Mar. 1977, pp. 1285-1287.
- A. Berlin et al., “Balanced Optical-Microwave Phase Detector for 800-nm Pulsed Lasers with Sub-Femtosecond Resolution”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 322-324.
- Y. T. Yan and Y. Cai, “Precision Measurement of Coupling Ellipses Parameters in a Storage Ring”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper MPPE059, pp. 3459-3461.
- G. D'Auria et al., “Installation and Tests of the X-Band Power Plant for the FERMI@Elettra Project”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper THPPC054, pp. 3410-3412.
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