[n] R. I. Cutler, D. L. Mohr, J. K. Whittaker, and N. R. Yoder, “A High Resolution Wire Scanner Beam Profile Monitor with a Microprocessor Data Acquisition System”, in Proc. PAC'83, Santa Fe, NM, USA, Mar. 1983, pp. 2213-2216.
[n] Y. Yang, X. Y. Lu, W. W. Tan, L. Xiao, D. Xie, and L. Zhu, “Pulse Laser Annealing of Niobium Film on Copper for SRF Cavities”, in Proc. SRF'19, Dresden, Germany, Jun.-Jul. 2019, pp. 848-851. doi:10.18429/JACoW-SRF2019-THP009
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