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[n]	M. Yan, B. Beutner, C. Gerth, R. Ischebeck, and E. Prat, “Comparison of Quadrupole Scan and Multi-screen Method for the Measurement of Projected and Slice Emittance at the SwissFEL Injector Test Facility”, in Proc. FEL'14, Basel, Switzerland, Aug. 2014, paper THP088, pp. 941-944. 

[n]	A. D. Palczewski, R. L. Geng, and H. Tian, “Optimizing Centrifugal Barrel Polishing for Mirror Finish SRFCavity and Rf Tests at Jefferson Lab”, in Proc. IPAC'12, New Orleans, LA, USA, May 2012, paper WEPPC094, pp. 2435-2437. 

[n]	C. Xu, M. J. Kelley, C. E. Reece, and H. Tian, “Characterization of Scale-Dependent Roughness of Niobium Surfaces as a Function of Surface Treatment Processes”, in Proc. SRF'11, Chicago, IL, USA, Jul. 2011, paper THPO046, pp. 832-834. 

[n]	J. H. Han, “Design of a Low Emittance and High Repetition Rate S-band Photoinjector”, in Proc. FEL'11, Shanghai, China, Aug. 2011, paper THPB29, pp. 621-624. 

[n]	S. Nakata, “Experiment of Fast-Electron Extraction System”, in Proc. PAC'87, Washington D.C., USA, Mar. 1987, pp. 1535-1537. 

For LaTeX

%\cite{Yan:FEL14-THP088} \bibitem{Yan:FEL14-THP088} M. Yan, B. Beutner, C. Gerth, R. Ischebeck, and E. Prat, \textquotedblleft{Comparison of Quadrupole Scan and Multi-screen Method for the Measurement of Projected and Slice Emittance at the SwissFEL Injector Test Facility}\textquotedblright, in \emph{Proc. FEL’14}, Basel, Switzerland, Aug. 2014, paper THP088, pp. 941--944. %\cite{Palczewski:IPAC12-WEPPC094} \bibitem{Palczewski:IPAC12-WEPPC094} A. D. Palczewski, R. L. Geng, and H. Tian, \textquotedblleft{Optimizing Centrifugal Barrel Polishing for Mirror Finish SRFCavity and Rf Tests at Jefferson Lab}\textquotedblright, in \emph{Proc. IPAC’12}, New Orleans, LA, USA, May 2012, paper WEPPC094, pp. 2435--2437. %\cite{CXu:SRF11-THPO046} \bibitem{CXu:SRF11-THPO046} C. Xu, M. J. Kelley, C. E. Reece, and H. Tian, \textquotedblleft{Characterization of Scale-Dependent Roughness of Niobium Surfaces as a Function of Surface Treatment Processes}\textquotedblright, in \emph{Proc. SRF’11}, Chicago, IL, USA, Jul. 2011, paper THPO046, pp. 832--834. %\cite{Han:FEL11-THPB29} \bibitem{Han:FEL11-THPB29} J. H. Han, \textquotedblleft{Design of a Low Emittance and High Repetition Rate S-band Photoinjector}\textquotedblright, in \emph{Proc. FEL’11}, Shanghai, China, Aug. 2011, paper THPB29, pp. 621--624. %\cite{Nakata:PAC87} \bibitem{Nakata:PAC87} S. Nakata, \textquotedblleft{Experiment of Fast-Electron Extraction System}\textquotedblright, in \emph{Proc. PAC’87}, Washington D.C., USA, Mar. 1987, pp. 1535--1537.

For BibTeX

@inproceedings{yan:fel14-thp088, author = {M. Yan and B. Beutner and C. Gerth and R. Ischebeck and E. Prat}, title = {{Comparison of Quadrupole Scan and Multi-screen Method for the Measurement of Projected and Slice Emittance at the SwissFEL Injector Test Facility}}, booktitle = {Proc. FEL'14}, pages = {941--944}, paper = {THP088}, venue = {Basel, Switzerland, Aug. 2014}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/FEL2014/papers/THP088.pdf}, language = {english} } @inproceedings{palczewski:ipac12-weppc094, author = {A. D. Palczewski and R. L. Geng and H. Tian}, title = {{Optimizing Centrifugal Barrel Polishing for Mirror Finish SRFCavity and Rf Tests at Jefferson Lab}}, booktitle = {Proc. IPAC'12}, pages = {2435--2437}, paper = {WEPPC094}, venue = {New Orleans, LA, USA, May 2012}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/IPAC2012/papers/WEPPC094.pdf}, language = {english} } @inproceedings{cxu:srf11-thpo046, author = {C. Xu and M. J. Kelley and C. E. Reece and H. Tian}, title = {{Characterization of Scale-Dependent Roughness of Niobium Surfaces as a Function of Surface Treatment Processes}}, booktitle = {Proc. SRF'11}, pages = {832--834}, paper = {THPO046}, venue = {Chicago, IL, USA, Jul. 2011}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/SRF2011/papers/THPO046.pdf}, language = {english} } @inproceedings{han:fel11-thpb29, author = {J. H. Han}, title = {{Design of a Low Emittance and High Repetition Rate S-band Photoinjector}}, booktitle = {Proc. FEL'11}, pages = {621--624}, paper = {THPB29}, venue = {Shanghai, China, Aug. 2011}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/FEL2011/papers/THPB29.pdf}, language = {english} } @inproceedings{nakata:pac87, author = {S. Nakata}, title = {{Experiment of Fast-Electron Extraction System}}, booktitle = {Proc. PAC'87}, pages = {1535--1537}, paper = {}, venue = {Washington D.C., USA, Mar. 1987}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} }

References

• M. Yan, B. Beutner, C. Gerth, R. Ischebeck, and E. Prat, “Comparison of Quadrupole Scan and Multi-screen Method for the Measurement of Projected and Slice Emittance at the SwissFEL Injector Test Facility”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THP088, pp. 941-944.
• A. D. Palczewski, R. L. Geng, and H. Tian, “Optimizing Centrifugal Barrel Polishing for Mirror Finish SRFCavity and Rf Tests at Jefferson Lab”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper WEPPC094, pp. 2435-2437.
• C. Xu, M. J. Kelley, C. E. Reece, and H. Tian, “Characterization of Scale-Dependent Roughness of Niobium Surfaces as a Function of Surface Treatment Processes”, in Proc. 15th Int. Conf. RF Superconductivity (SRF'11), Chicago, IL, USA, Jul. 2011, paper THPO046, pp. 832-834.
• J. H. Han, “Design of a Low Emittance and High Repetition Rate S-band Photoinjector”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPB29, pp. 621-624.
• S. Nakata, “Experiment of Fast-Electron Extraction System”, in Proc. 12th Particle Accelerator Conf. (PAC'87), Washington D.C., USA, Mar. 1987, pp. 1535-1537.