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[n]	G. M. Ge et al., “Surface Topography Techniques at Cornell University: Optical Inspection and Surface Replica”, in Proc. IPAC'16, Busan, Korea, May 2016, pp. 2292-2294. doi:10.18429/JACoW-IPAC2016-WEPMR015
[n]	M. F. Stroosnijder and K. Abbas, “Thin Layer Activation for Materials Research Development at IAM of the European Commission”, in Proc. Cyclotrons'98, Caen, France, Jun. 1998, paper A-10, pp. 52-57. 
[n]	K. Abbas, “USE OF THE SCANDITRONIX MC 40 CYCLOTRON OF THE JRC (EC) FOR FDG PRODUCTION IN COMPLIANCE WITH THE EUROPEAN GMP”, in Proc. Cyclotrons'04, Tokyo, Japan, Oct. 2004, paper 19P05, pp. XX-XX. 

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