[n] D. S??tterlin, V. Schlott, H. Sigg, and H. Jackel, “Development of a Bunch-Length Monitor with Sub-Picosecond Time Resolution and Single-Shot Capability”, in Proc. DIPAC'03, Mainz, Germany, May 2003, paper PT24, pp. XX-XX.
[n] J. W. Flanagan, S. Hiramatsu, and T. Mitsuhashi, “Automatic Continuous Transverse Beam-size Measurement System for KEKB”, in Proc. EPAC'00, Vienna, Austria, Jun. 2000, paper WEP5A10, pp. 1714-1716.
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