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[n]	B. Epsztein and D. Tronc, “Phase Measurement Along Linac Sections by a Resonant Method”, in Proc. LINAC'66, Los Alamos, NM, USA, Oct. 1966, paper IV-12, pp. 198-200. 
[n]	M. Penno et al., “A configurable Interlock System for RF Stations at XFEL”, in Proc. PCaPAC'08, Ljbuljana, Slovenia, Oct. 2008, paper WEZ03, pp. 159-161. 
[n]	F. Bordry et al., “LEP Operation in 1992 with a 90[degree] Optics”, in Proc. PAC'93, Washington D.C., USA, Mar. 1993, pp. 2001-2004. 
[n]	D. Goetz, J. Grillenberger, M. Humbel, R. Kan, M. Schneider, L. Stingelin, and H. Zhang, “Disturbance Effects Caused by RF Power Leaking Out From Cavities in the PSI Ringcyclotron”, in Proc. Cyclotrons'10, Lanzhou, China, Sep. 2010, paper WEM2CCO03, pp. 341-343. 
[n]	R. Cee et al., “Investigation of TTF Injector Alignment with the Simulation Code V”, in Proc. PAC'01, Chicago, IL, USA, Jun. 2001, paper RPAH105, pp. 3096-3098. 
[n]	F. Caspers and A. Schwinn, “A New Bench Method to Simulate Electromagnetic Fields of Slow Beams”, in Proc. EPAC'90, Nice, France, Jun. 1990, pp. 1037-1040. 
[n]	D. Tronc, C. Bourat, J. P. Georges, A. Setty, and B. Spataro, “Design of a High Intensity Electron Buncher”, in Proc. LINAC'86, Stanford, CA, USA, Sep. 1986, paper TH3-15, pp. 472-474. 
[n]	S. Hartman, V. N. Litvinenko, I. Pinayev, G. Swift, and Y. Wu, “Control System Design and Upgrade Considerations for the Duke Free Electron Laser Laboratory”, in Proc. PAC'01, Chicago, IL, USA, Jun. 2001, paper MPPH009, pp. 785-787. 
[n]	S. Battisti, J. F. Bottollier, B. Frammery, B. Szeless, and M. Van Rooy, “Beam Instrumentation in the LEP Pre-Injector”, in Proc. PAC'87, Washington D.C., USA, Mar. 1987, pp. 570-573. 
[n]	D. K. Morris et al., “Operational Use of Ionization Profile Monitors in the Fermilab Main Injector”, in Proc. PAC'11, New York, NY, USA, Mar.-Apr. 2011, paper MOP222, pp. 519-521. 
[n]	J. D. Sherman et al., “Review of Scaled Penning H- Surface Plasma Source with Slit Emitters for High Duty Factor Linacs”, in Proc. EPAC'02, Paris, France, Jun. 2002, paper THALA002, pp. 284-286. 

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