[n] B. Keil, “Beam Position Measurement with Sub-Micron Resolution”, in Proc. DIPAC'09, Basel, Switzerland, May 2009, paper TUOC01, pp. 275-279.
[n] R. C. Vondrasek, T. Palchan, R. C. Pardo, C. E. Peters, M. A. Power, and R. H. Scott, “A Multi-Sample Changer Coupled to an ECR Source for AMS Experiments”, in Proc. ECRIS'12, Sydney, Australia, Sep. 2012, paper WEPP17, pp. 146-148.
Use Complete Form